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Zainalabedin Navabi
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| School of Electrical & Computer Engineering |
| Professor |
| Email: navabi [AT] ece.neu.edu |
| Personal Website: |
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| Education |
Ph.D.: Electrical Engineng, University of Arizona, 1981
M.Sc.: Electrical Engineering, University of Arizona, 1978
B.Sc.: Electrical Engineering, University of Texas, 1975
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| Research Interests |
Test and Testable Design
Changing Syllabus of Foundation of Computer Programming Course
CAD for Digital Systems
System Level(ESL)Design and Modeling
VLSI Design Methodology
Object Oriented Programming
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| Current Researches |
Concurrent Testing
SoC Test Methods
Transaction Level Design
Configurable Hardware/Software Design
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| Courses |
Digital Design With HDL
Embedded Systems
Test and Testable Design
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| Selected Publications |
1) Z.Navabi, "Verilog Computer-Based Training Course", McGraw Hill Company, N.Y.,New Yourk, 2002, ISBN:0-07-137473-6.
2) Z.Navabi,"Digital Design and Implementation with Field Programmable Devices", Springer Publishers, 2004, ISBN:1-4020-8011-5.
3) Z.Navabi, "Verilog Digital System Design", Second Edition. McGraw Hill Company, N.Y., New Yourk, 2006, ISBN:0-07-144564-1.
4) Zainalabedin Navabi with S. Shamshiri and H.Esmaeilzadeh, "Instruction- Level Test Methodology for CPU Core Self-Testing", ACM Transactions on Design Automation of Electronic Systems, Vol.10, No.4, Oct.2005.
5) Zainalabedin Navabi with M. Saneei, A. Afzali-Kusha, "Sign Bit Reduction Encoding for Low Power applications", Design Automation Conference(DAC)2005, Anaheim, CA,June13-17 2005.
6) Zainalabedin Navabi with Sh. Sharifi, J. Jafari, M. Hosseinabady and A. Afzali-Kusha, " Simultaneous Reduction of Dynamic and Static Power in Scan Structures", DATE 2005, March 7-11, Munich, Germany.
7) Zainalabedin Navabi with Shahrzad Mirkhani "Enhancing Fault Simulation Performance by Dynamic Fault Clustering", Asian Test Symposium (ATS"5), pp. 278-283, Dec. 18-21, 2005, Calcutta, India.
8) Zainalabedin Navabi with Ehsan Atoofian, "A Test Approach for Look-Up Table Based FPGAs", Journal of Computer Science and Technology", Kluwer Boston Inc., Vol. 21, No.1,pp. 141-146, Jan.2006.
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